Impact of Scan Rate and Mobile Ion Concentration on the Anomalous J-V Curves of Metal Halide Perovskite-based Memristors

IEEE Electron Device Letters, 2023,

Pérez-Martínez, J.Carlos; Martín-Martín, D.; Del Pozo, G.; Arredondo, B.; Guerrero, A.; Romero, B.

Impact of Scan Rate and Mobile Ion Concentration on the Anomalous J-V Curves of Metal Halide Perovskite-based Memristors.

Article page: https://ieeexplore.ieee.org/document/10158999/